Lahsen Assoufid: search on Z-Library

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1

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Advances in Metrology for X-Ray and EUV Optics - High performance Fizeau and scanning white-light interferometers for mid-spatial frequency optical testing of free-form optics

Deck, Leslie L., Assoufid, Lahsen, Takacs, Peter Z., Evans, Chris, Taylor, John S.

Year:

2005

Language:

english

File:

PDF, 338 KB

english, 2005

2

Development and implementation of a portable grating interferometer system as a standard tool for testing optics at the Advanced Photon Source beamline 1-BM

Assoufid, Lahsen, Shi, Xianbo, Marathe, Shashidhara, Benda, Erika, Wojcik, Michael J., Lang, Keenan, Xu, Ruqing, Liu, Wenjun, Macrander, Albert T., Tischler, Jon Z.

Journal:

Review of Scientific Instruments

Year:

2016

Language:

english

File:

PDF, 1.85 MB

english, 2016

3

SPIE Proceedings [SPIE Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016) - Suzhou, China (Tuesday 26 April 2016)] 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics - How to specify super-smooth mirrors: simulation studies on nano-focusing and wavefront preserving x-ray mirrors for next-generation light sources

Qian, Shinan, Idir, Mourad, Cocco, Daniele, Xiao, Tiqiao, Yamauchi, Kazuto, Shi, Xianbo, Assoufid, Lahsen, Reininger, Ruben

Year:

2016

Language:

english

File:

PDF, 996 KB

english, 2016

4

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Advances in X-Ray/EUV Optics and Components VII - Achieving optimal flatness and surface roughness properties for novel x-ray optic structures formed by dicing saws

Wieczorek, Michael, Khachatryan, Ruben, Shvyd'ko, Yuri, Smith, Robert H., Iwasaki, Kenichi, Miller, Suzanne, Qian, Jun, Huang, Xianrong, Assoufid, Lahsen, Goto, Shunji, Morawe, Christian, Khounsary, A

Year:

2012

Language:

english

File:

PDF, 868 KB

english, 2012

5

SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] High Heat Flux and Synchrotron Radiation Beamlines - Thermal contact resistance across a copper-silicon interface

Khounsary, Ali M., Chojnowski, David, Assoufid, Lahsen, Worek, William M., Macrander, Albert T., Khounsary, Ali M.

Year:

1997

Language:

english

File:

PDF, 464 KB

english, 1997

6

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Advances in Metrology for X-Ray and EUV Optics - A new designed ultra-high precision profiler

Higashi, Y., Assoufid, Lahsen, Takacs, Peter Z., Takaie, Y., Endo, K., Taylor, John S., Kume, T., Enami, K., Yamauchi, K., Yamamura, K., Sano, H., Ueno, K., Mori, Y.

Year:

2005

Language:

english

File:

PDF, 795 KB

english, 2005

7

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Advances in Metrology for X-Ray and EUV Optics III - Surface profile measurement of KB mirrors using Fizeau laser interferometer

Qian, J., Assoufid, Lahsen, Takacs, Peter Z., Assoufid, L., Liu, C., Asundi, Anand K., Shi, B., Liu, W.

Year:

2010

Language:

english

File:

PDF, 697 KB

english, 2010

8

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Advances in Metrology for X-Ray and EUV Optics III - Recent upgrades to the Diamond-NOM: A slope measuring profiler capable of characterizing the surface profile of large optics with sub-nanometer repeatability

Alcock, Simon G., Assoufid, Lahsen, Takacs, Peter Z., Sawhney, Kawal J. S., Scott, Stewart, Asundi, Anand K.

Year:

2010

Language:

english

File:

PDF, 8.78 MB

english, 2010

9

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Advances in Metrology for X-Ray and EUV Optics V - A new x-ray optics laboratory (XROL) at the ALS: mission, arrangement, metrology capabilities, performance, and future plans

Assoufid, Lahsen, Ohashi, Haruhiko, Asundi, Anand K., Yashchuk, Valeriy V., Artemiev, Nikolay A., Lacey, Ian, McKinney, Wayne R., Padmore, Howard A.

Year:

2014

Language:

english

File:

PDF, 1.22 MB

english, 2014

10

Improved algorithm for processing grating-based phase contrast interferometry image sets

Marathe, Shashidhara, Assoufid, Lahsen, Xiao, Xianghui, Ham, Kyungmin, Johnson, Warren W., Butler, Leslie G.

Journal:

Review of Scientific Instruments

Year:

2014

Language:

english

File:

PDF, 681 KB

english, 2014

11

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advances in Metrology for X-Ray and EUV Optics II - Comparison of slope and height profiles for flat synchrotron x-ray mirrors measured with a long trace profiler and a PMI Fizeau interferometer

Qian, Jun, Assoufid, Lahsen, Takacs, Peter Z., Assoufid, Lahsen, Macrander, Albert, Ohtsuka, Masaru

Year:

2007

Language:

english

File:

PDF, 483 KB

english, 2007

12

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Advances in Metrology for X-Ray and EUV Optics III - A double-pass Fizeau interferometer system for measuring the figure error of large synchrotron optics

Ludbrook, Geoff D., Assoufid, Lahsen, Takacs, Peter Z., Alcock, Simon G., Scott, Stewart, Asundi, Anand K.

Year:

2010

Language:

english

File:

PDF, 2.57 MB

english, 2010

13

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Advances in Metrology for X-Ray and EUV Optics V - Front Matter: Volume 9206

Assoufid, Lahsen, Ohashi, Haruhiko, Asundi, Anand K., SPIE, Proceedings of

Year:

2014

Language:

english

File:

PDF, 323 KB

english, 2014

14

First-principles simulation of the interaction between adamantane and an atomic-force-microscope tip

Zhang, G. P., George, Thomas F., Assoufid, Lahsen, Mansoori, G. Ali

Journal:

Physical Review B

Year:

2007

Language:

english

File:

PDF, 577 KB

english, 2007

15

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advances in Metrology for X-Ray and EUV Optics II - Progress in the x-ray optics and metrology lab at Diamond Light Source

Alcock, Simon G., Sawhney, K. J. S., Assoufid, Lahsen, Takacs, Peter Z., Ohtsuka, Masaru

Year:

2007

Language:

english

File:

PDF, 1.39 MB

english, 2007

16

SPIE Proceedings [SPIE Micromachining and Microfabrication - San Jose, CA (Saturday 24 January 2004)] Micromachining Technology for Micro-Optics and Nano-Optics II - At the limit of nondispersive micro- and nanofocusing mirror optics

Ice, Gene E., Johnson, Eric G., Nordin, Gregory P., Specht, Eliot D., Tischler, Jonathan Z., Khounsary, Ali M., Assoufid, Lahsen, Liu, Chian

Year:

2004

Language:

english

File:

PDF, 600 KB

english, 2004

17

Performance of the APS optical slope measuring system

Qian, Jun, Sullivan, Joe, Erdmann, Mark, Khounsary, Ali, Assoufid, Lahsen

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

2013

Language:

english

File:

PDF, 325 KB

english, 2013

18

International workshop on metrology for x-ray and neutron optics

Assoufid, Lahsen, Irick, Steve

Journal:

Synchrotron Radiation News

Year:

2000

Language:

english

File:

PDF, 1.42 MB

english, 2000

19

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, CA (Sunday 31 July 2005)] Advances in Metrology for X-Ray and EUV Optics - New optical setup for the generation of variable spot size on third generation synchrotron beamlines

Moreno, Thierry, Belkhou, Rachid, Cauchon, Gilles, Idir, Mourad, Assoufid, Lahsen, Takacs, Peter Z., Taylor, John S.

Year:

2005

Language:

english

File:

PDF, 507 KB

english, 2005

20

Hard x-ray spectroscopy and imaging by a reflection zone plate in the presence of astigmatism

Braig, Christoph, Löchel, Heike, Firsov, Alexander, Brzhezinskaya, Maria, Hafner, Aljosa, Rehanek, Jens, Wojcik, Michael, Macrander, Albert, Assoufid, Lahsen, Erko, Alexei

Journal:

Year:

2016

Language:

english

File:

PDF, 1.71 MB

english, 2016

21

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Advances in Metrology for X-Ray and EUV Optics V - Pushing the limits: latest developments in angle metrology for the inspection of ultra-precise synchrotron optics

Assoufid, Lahsen, Ohashi, Haruhiko, Asundi, Anand K., Yandayan, Tanfer, Geckeler, Ralf D., Siewert, Frank

Year:

2014

Language:

english

File:

PDF, 895 KB

english, 2014

22

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advances in Metrology for X-Ray and EUV Optics II - Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-x-ray mirrors

Rommeveaux, A., Assoufid, Lahsen, Takacs, Peter Z., Assoufid, L., Ohashi, H., Ohtsuka, Masaru, Mimura, H., Yamauchi, K., Qian, J., Ishikawa, T., Morawe, C., Macrander, A. T., Khounsary, A., Goto, S.

Year:

2007

Language:

english

File:

PDF, 522 KB

english, 2007

23

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Advances in Metrology for X-Ray and EUV Optics IV - Measurement of groove density variation of varied-line-space grating for high-resolution soft x-ray monochromator

Senba, Y., Kishimoto, H., Miura, T., Ohashi, H., Goto, S., Ishikawa, T., Assoufid, Lahsen, Takacs, Peter Z., Asundi, Anand K.

Year:

2012

Language:

english

File:

PDF, 118 KB

english, 2012

24

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II - Uncertainties in aspheric profile measurements with the geometry measuring machine at NIST

Griesmann, Ulf, Duparr½Á, Angela, Singh, Bhanwar, Machkour-Deshayes, Nadia, Soons, Johannes, Gu, Zu-Han, Kim, Byoung C., Wang, Quandou, Stoup, John R., Assoufid, Lahsen

Year:

2005

Language:

english

File:

PDF, 767 KB

english, 2005

25

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Advances in Metrology for X-Ray and EUV Optics V - Upgrade of surface profiler for x-ray mirror at SPring-8

Assoufid, Lahsen, Ohashi, Haruhiko, Asundi, Anand K., Senba, Y., Kishimoto, H., Miura, T., Ohashi, H.

Year:

2014

Language:

english

File:

PDF, 1.37 MB

english, 2014

26

[Topics in Applied Physics] Molecular Building Blocks for Nanotechnology Volume 109 ||

Mansoori, G. Ali, George, Thomas F., Assoufid, Lahsen, Zhang, Guoping

Year:

2007

Language:

english

File:

PDF, 12.92 MB

english, 2007

27

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advances in Metrology for X-Ray and EUV Optics II - Microstitching interferometer and relative angle determinable stitching interferometer for half-meter-long x-ray mirror

Ohashi, Haruhiko, Tsumura, Takashi, Okada, Hiromi, Mimura, Hidekazu, Masunaga, Tatsuhiko, Senba, Yasunori, Goto, Shunji, Yamauchi, Kazuto, Ishikawa, Tetsuya, Assoufid, Lahsen, Takacs, Peter Z., Ohtsuk

Year:

2007

Language:

english

File:

PDF, 1.18 MB

english, 2007

28

SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] High Heat Flux Engineering III - Contact-cooled U monochromators for high heat load x-ray beamlines

Khounsary, Ali M., Yun, Wenbing, Trakhtenberg, Emil M., Xu, Shenglan, Assoufid, Lahsen, Lee, Wah Keat, Khounsary, Ali M.

Year:

1996

Language:

english

File:

PDF, 699 KB

english, 1996

29

Fabrication and evaluation of variable focus X-ray lenses

Ali Khounsary, Eric M. Dufresne, Cameron M. Kewish, Jun Qian, Lahsen Assoufid, Ray Conley

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

2007

Language:

english

File:

PDF, 228 KB

english, 2007

30

Improvements in the Accuracy and the Repeatability of Long Trace Profiler Measurements

Takacs, Peter Z., Church, Eugene L., Bresloff, Cynthia J., Assoufid, Lahsen

Journal:

Year:

1999

Language:

english

File:

PDF, 216 KB

english, 1999

31

[Topics in Applied Physics] Molecular Building Blocks for Nanotechnology Volume 109 || Diamondoids as Molecular Building Blocks for Nanotechnology

Mansoori, G. Ali, George, Thomas F., Assoufid, Lahsen, Zhang, Guoping

Year:

2007

Language:

english

File:

PDF, 416 KB

english, 2007

32

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, CA (Sunday 31 July 2005)] Advances in Metrology for X-Ray and EUV Optics - Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories

Assoufid, Lahsen, Rommeveaux, Amparo, Ohashi, Haruhiko, Yamauchi, Kazuto, Mimura, Hidekazu, Qian, Jun, Hignette, Olivier, Ishikawa, Tetsuya, Morawe, Christian, Macrander, Albert, Khounsary, Ali, Goto,

Year:

2005

Language:

english

File:

PDF, 2.20 MB

english, 2005

33

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Advances in Metrology for X-Ray and EUV Optics VI - Subaperture stitching interferometry with reduced reference errors for ultrasmooth surfaces

Assoufid, Lahsen, Ohashi, Haruhiko, Asundi, Anand K., Xu, Xudong, Huang, Qiushi, Shen, Zhengxiang, Wang, Zhanshan

Year:

2016

Language:

english

File:

PDF, 850 KB

english, 2016

34

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Advances in Metrology for X-Ray and EUV Optics VI - Fiber-optic based in situ atomic spectroscopy for manufacturing of x-ray optics

Assoufid, Lahsen, Ohashi, Haruhiko, Asundi, Anand K., Atanasoff, George, Metting, Christopher J., von Bredow, Hasso

Year:

2016

Language:

english

File:

PDF, 4.19 MB

english, 2016

35

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Advances in Metrology for X-Ray and EUV Optics VI - Measurement of aspheric mirror by nanoprofiler using normal vector tracing

Assoufid, Lahsen, Ohashi, Haruhiko, Asundi, Anand K., Kitayama, Takao, Shiraji, Hiroki, Yamamura, Kazuya, Endo, Katsuyoshi

Year:

2016

Language:

english

File:

PDF, 4.26 MB

english, 2016

36

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Advances in Metrology for X-Ray and EUV Optics V - The developmental long trace profiler (DLTP) optimized for metrology of side-facing optics at the ALS

Assoufid, Lahsen, Ohashi, Haruhiko, Asundi, Anand K., Lacey, Ian, Artemiev, Nikolay A., Domning, Edward E., McKinney, Wayne R., Morrison, Gregory Y., Morton, Simon A., Smith, Brian V., Yashchuk, Valer

Year:

2014

Language:

english

File:

PDF, 1.49 MB

english, 2014

37

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Advances in Metrology for X-Ray and EUV Optics III - Front Matter for Volume 7801

SPIE, Proceedings of, Assoufid, Lahsen, Takacs, Peter Z., Asundi, Anand K.

Year:

2010

Language:

english

File:

PDF, 244 KB

english, 2010

38

SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications II - Vibration diagnosis and remediation design for an x-ray optics stitching interferometer system

Preissner, Curt A., Khounsary, Ali M., Dinger, Udo, Assoufid, Lahsen, Shu, Deming, Ota, Kazuya

Year:

2004

Language:

english

File:

PDF, 1.49 MB

english, 2004

39

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Advances in Metrology for X-Ray and EUV Optics III - Large-field high-energy KB microscope with aperiodic multilayer

Yi, Shengzhen, Assoufid, Lahsen, Takacs, Peter Z., Mu, Baozhong, Wang, Zhanshan, Asundi, Anand K., Wang, Xin, Jiang, Li, Zhu, Jingtao

Year:

2010

Language:

english

File:

PDF, 923 KB

english, 2010

40

Next-generation materials for future synchrotron and free-electron laser sources

Assoufid, Lahsen, Graafsma, Heinz

Journal:

Year:

2017

Language:

english

File:

PDF, 18.99 MB

english, 2017

41

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advances in Metrology for X-Ray and EUV Optics II - Precision tiltmeter as a reference for slope measuring instruments

Kirschman, Jonathan L., Domning, Edward E., Morrison, Gregory Y., Smith, Brian V., Yashchuk, Valeriy V., Assoufid, Lahsen, Takacs, Peter Z., Ohtsuka, Masaru

Year:

2007

Language:

english

File:

PDF, 1.09 MB

english, 2007

42

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Advances in Metrology for X-Ray and EUV Optics III - Developmental long trace profiler using optimally aligned mirror based pentaprism

Barber, Samuel K., Assoufid, Lahsen, Takacs, Peter Z., Morrison, Gregory Y., Yashchuk, Valeriy V., Asundi, Anand K., Gubarev, Mikhail V., Geckeler, Ralf D., Buchheim, Jana, Siewert, Frank, Zeschke, Th

Year:

2010

Language:

english

File:

PDF, 2.62 MB

english, 2010

43

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Advances in Metrology for X-Ray and EUV Optics IV - Optimal setting of bendable optics based on FEA calculations

Artemiev, Nikolay A., Chow, Ken P., La Civita, Daniele, Merthe, Daniel J., Chuang, Yi-De, McKinney, Wayne R., Yashchuk, Valeriy V., Assoufid, Lahsen, Takacs, Peter Z., Asundi, Anand K.

Year:

2012

Language:

english

File:

PDF, 1.08 MB

english, 2012

44

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Advances in Metrology for X-Ray and EUV Optics IV - Progress of multi-beam long trace-profiler development

Gubarev, Mikhail V., Merthe, Daniel J., Kilaru, Kiranmayee, Kester, Thomas, Eng, Ron, Ramsey, Brian, McKinney, Wayne R., Takacs, Peter Z., Yashchuk, Valeriy V., Assoufid, Lahsen, Takacs, Peter Z., Asu

Year:

2012

Language:

english

File:

PDF, 690 KB

english, 2012

45

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Advances in Metrology for X-Ray and EUV Optics V - Experimental results for absolute cylindrical wavefront testing

Assoufid, Lahsen, Ohashi, Haruhiko, Asundi, Anand K., Reardon, Patrick J., Alatawi, Ayshah

Year:

2014

Language:

english

File:

PDF, 997 KB

english, 2014

46

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advances in Metrology for X-Ray and EUV Optics II - Systematic error reduction: non-tilted reference beam method for long trace profiler

Qian, Shinan, Assoufid, Lahsen, Takacs, Peter Z., Qian, Kun, Hong, Yiling, Ohtsuka, Masaru, Sheng, Liusi, Ho, Tonglin, Takacs, Peter

Year:

2007

Language:

english

File:

PDF, 892 KB

english, 2007

47

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Advances in Metrology for X-Ray and EUV Optics IV - Using MountainsMap (Digital Surf) surface analysis software as an analysis tool for x-ray mirror optical metrology data

Duffy, Alan, Yates, Brian, Takacs, Peter, Assoufid, Lahsen, Takacs, Peter Z., Asundi, Anand K.

Year:

2012

Language:

english

File:

PDF, 729 KB

english, 2012

48

Elliptical x-ray microprobe mirrors by differential deposition

Ice, Gene E., Chung, Jin-Seok, Tischler, Jonathan Z., Lunt, Andrew, Assoufid, Lahsen

Journal:

Review of Scientific Instruments

Year:

2000

Language:

english

File:

PDF, 564 KB

english, 2000

49

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Advances in Metrology for X-Ray and EUV Optics IV - Review of substrate materials, surface metrologies and polishing techniques for current and future-generation EUV/x-ray optics

Soufli, Regina, Baker, Sherry L., Gullikson, Eric M., McCarville, Tom, Robinson, Jeffrey C., Martínez-Galarce, Dennis, Fernández-Perea, Mónica, Pivovaroff, Michael J., Assoufid, Lahsen, Takacs, Peter

Year:

2012

Language:

english

File:

PDF, 818 KB

english, 2012

50

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advances in Metrology for X-Ray and EUV Optics II - Proposal for a universal test mirror for characterization of slope measuring instruments

Yashchuk, Valeriy V., Assoufid, Lahsen, Takacs, Peter Z., McKinney, Wayne R., Warwick, Tony, Ohtsuka, Masaru, Noll, Tino, Siewert, Frank, Zeschke, Thomas, Geckeler, Ralf D.

Year:

2007

Language:

english

File:

PDF, 1.13 MB

english, 2007

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